The semiconductor industry has now become an important symbol to measure a country‘s industrial competitiveness and comprehensive national strength. With the semiconductor industry entering the nano era, the impurity content has become a very sensitive existence. How to detect the impurity content has become an important challenge facing the semiconductor industry interface. East-West Analytics has a variety of inductively coupled plasma spectrometers (ICP-OES), inductively coupled plasma time-of-flight mass spectrometers (ICP-TOF MS) and other products provide reliable detection methods for trace metal element analysis in the semiconductor industry from materials, integrated circuit manufacturing or to packaging and testing, and help improve product quality. This paper uses ICP to establish a method for the determination of gallium, iron, vanadium, copper, calcium, magnesium, aluminum and zinc in saturated resins for relevant personnel‘s reference. Attachment download